Optical wavelength analyzer and image processing system utilizing Josephson junctions
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United States of America Patent
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Mar 21, 1989
Grant Date -
N/A
app pub date -
Sep 3, 1987
filing date -
Sep 3, 1987
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus for measuring the intensity of incident optical radiation utilizes the properties of superconductivity films. The apparatus may include at least one Josephson junction having the optical radiation incident thereupon, an electronic circuit coupled to receive a signal from the Josephson junction proportional to the incident radiation. The Josephson junction has a time-current switching threshold current selected to switch the function 50% of the time. A feedback loop from the electronic circuit maintains the function operation. One or more junctions may be used to monitor radiation of different wavelengths or to produce optical images.
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