Position measuring method
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United States of America Patent
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Apr 25, 1989
Issued Date -
N/A
app pub date -
Apr 22, 1987
filing date -
Apr 23, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Points on a pair of images obtained by imaging an object are finely corresponded in order to precisely measure the three-dimensional position of the object. For this purpose, attractive forces corresponding to features of the images are calculated, and the degree of correspondence between the points on the pair of images is evaluated relying upon the magnitude of the attractive force, in order to determine the corresponding points and to calculate the position of the object relying upon the thus determined corresponding points. Further, an occluded region which contains no corresponding point is detected and is removed, in order to further improve the precision for measuring the position.
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