Fringe pattern phase detection system

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United States of America Patent

PATENT NO 4836681
SERIAL NO

06867026

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Electro-optical apparatus measures the average relative phase of an incident wave fringe pattern. The subject fringe, e.g., an interferometric pattern, passes through three sections of an optical mask, one characterized by fixed transmissivity and the other two by quadrature-displaced spatial fringe patterns. The light passing through each section is separately collected and detected to average the respective incident wave/mask section interactions. The phase of the incident fringe pattern relative to the mask is then determined by arithmetically processing the detected signals. In accordance with one aspect of the present invention, the subject fringe pattern is time modulated and the quadrature-shifted mask signals A-C coupled to obviate the requirement for the third, fixed transmissivity mask section.

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Patent Owner(s)

Patent OwnerAddress
LOCKHEED ELECTRONICS CO INC 1501 U S HIGHWAY 22 C S #1 PLAINFIELD N J 07061 A CORP OF CANot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Reichenbach, Michael C Huntsville, AL 1 17
Tarasevich, Andrew Forrest Hills, NY 1 17
Van, Saders John G Asbury, NJ 1 17

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