Test period generator for automatic test equipment

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4849702
SERIAL NO

07282830

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A timing subsystem 10 including several test period generators for supplying a variety of timing signals to a device under test. Major, minor, and free-run period generators each supply various timing signals to a multiplexer 18, which selectively connects the timing signals to timing generators 20. A central processing unit 28 supplies data to the period generators and timing generators to define their respective timing signals. Timing signals generated by the major period generator 12 define the overall testing rate. The minor period generator 14 generates multiple timing signals within the periods of the major clock signals to permit higher clock rates. Timing signals that are independent of the major clock periods are generated by the free-run period generator 16. An external synchronizer circuit 26 provides a feedback loop from the device under test 22 to the major period generator. A reference driver trigger delay circuit 27 provides means for calibrating the timing generators. Each of the three period generators includes two interconnected timing interval generators 30 and 40 that alternately generate overlapping timing signals. Each timing interval generator includes a stop-restart oscillator 32, a counter 34, and a delay-line vernier 36. Upon the receipt of a start signal, the oscillator stops and restarts to align its clock pulses to the start signal. The oscillator output clocks the counter, which supplies a signal to the vernier when a preselected number is reached. The vernier delays the counter signal by a preselected delay and issues a signal that designates the end of the period.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
SCHLUMBERGER TECHNOLOGIES, INC.SAN JOSE, CA8

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Herlein, Richard F San Jose, CA 7 172
West, Burnell G Fremont, CA 39 672

Cited Art Landscape

Patent Info (Count) # Cites Year
 
GENERAL ELECTRIC COMPANY (1)
* 4519090 Testable time delay 10 1982
 
TERADYNE, INC. (1)
* 4450560 Tester for LSI devices and memory devices 76 1981
 
SCHLUMBERGER SYSTEMS AND SERVICES, INC. (2)
RE31056 Computer controlled high-speed circuit for testing electronic devices 56 1980
* 4488297 Programmable deskewing of automatic test equipment 22 1982
 
GENERAL SIGNAL CORPORATION (1)
* 4495468 Controlled phase off-set digital test system 20 1981
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (1)
* 5630109 Apparatus for processing of a series of timing signals 7 1995
 
SCHLUMBERGER AUTOMATED TEST EQUIPMENT (1)
6489793 Temperature control of electronic devices using power following feedback 75 1999
 
POLARIS INNOVATIONS LIMITED (2)
* 6754869 Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer 2 2001
* 2002/0008,503 Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer 1 2001
 
VERIGY (SINGAPORE) PTE. LTD. (1)
* 5289116 Apparatus and method for testing electronic devices 23 1992
 
MICRON TECHNOLOGY, INC. (7)
6230245 Method and apparatus for generating a variable sequence of memory device command signals 18 1997
6175894 Memory device command buffer apparatus and method and memory devices and computer systems using same 12 1997
6178488 Method and apparatus for processing pipelined memory commands 16 1998
6370627 Memory device command buffer apparatus and method and memory devices and computer systems using same 5 2000
6366992 Method and system for bypassing pipelines in a pipelined memory command generator 4 2000
6542569 Memory device command buffer apparatus and method and memory devices and computer systems using same 8 2001
6708262 Memory device command signal generator 12 2001
 
YOKOGAWA ELECTRIC CORPORATION (1)
* 5381045 Circuit for AC voltage application in synchronism with pattern signal generator 2 1993
 
SAMSUNG ELECTRONICS CO., LTD. (1)
* 2007/0101,219 Semiconductor testing apparatus and method of calibrating the same 0 2006
 
FUJITSU LIMITED (1)
* 5390224 Clock control apparatus 17 1993
 
HITACHI, LTD. (2)
* 5153883 Distributed timing signal generator 9 1989
* 5072178 Method and apparatus for testing logic circuitry by applying a logical test pattern 112 1990
 
RPX CLEARINGHOUSE LLC (1)
* 5349587 Multiple clock rate test apparatus for testing digital systems 125 1992
 
ARM LIMITED (1)
* 5642487 Integrated circuit and method of operation 12 1994
 
ROUND ROCK RESEARCH, LLC (7)
* 5996043 Two step memory device command buffer apparatus and method and memory devices and computer systems using same 65 1997
6484244 Method and system for storing and processing multiple memory commands 29 1997
6202119 Method and system for processing pipelined memory commands 13 1997
* 5946260 Method and system for storing and processing multiple memory addresses 58 1998
6519675 Two step memory device command buffer apparatus and method and memory devices and computer systems using same 9 1999
6360292 Method and system for processing pipelined memory commands 14 2000
6804743 Two step memory device command buffer apparatus and method and memory devices and computer systems using same 6 2002
 
NEC CORPORATION (1)
* 5225715 Narrow pulse eliminating circuit through transmission of input pulse signal using wide clock pulse 10 1992
 
DELTA DESIGN, INC. (3)
6476627 Method and apparatus for temperature control of a device during testing 64 1996
6650132 Method and apparatus for temperature control of a device during testing 11 2002
6788084 Temperature control of electronic devices using power following feedback 10 2002
 
RENESAS ELECTRONICS CORPORATION (1)
* 2008/0263,228 Single-chip microcomputer 2 2008
 
FACEBOOK, INC. (1)
* 7378831 System and method for determining a delay time interval of components 3 2007
 
XCERRA CORPORATION (6)
6940271 Pin electronics interface circuit 11 2002
6937006 Pin electronics interface circuit 5 2004
* 7099792 Synchronization of multiple test instruments 4 2004
* 2006/0074,584 Synchronization of multiple test instruments 1 2004
* 7177777 Synchronization of multiple test instruments 5 2004
* 2006/0085,157 Synchronization of multiple test instruments 2 2004
 
ADVANTEST CORPORATION (3)
* 4998025 Device for generating strobe pulses with a desired timing 13 1989
* 7623984 Test apparatus and electronic device 0 2007
* 2008/0234,969 TEST APPARATUS AND ELECTRONIC DEVICE 1 2007
 
CREDENCE SYSTEMS CORPORATION (1)
6671845 Packet-based device test system 2 1999
 
NPTEST, LLC (1)
* 2005/0024,041 Pin electronics interface circuit 1 2004
* Cited By Examiner