Detachable high-speed opto-electronic sampling probe
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United States of America Patent
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Jul 25, 1989
Grant Date -
N/A
app pub date -
Jan 15, 1988
filing date -
Jan 15, 1988
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A testing or sampling probe to determine the response of electrical circuits or devices to ultrafast electrical pulses. The probe is detachable from the device being tested. The probe includes a transparent substrate though which optical pulses are focused or directed onto a photoconducting gap. The probe further includes a transmission line associated with the photoconductive gap, and which terminates at a tapered end of the probe in contacts which are placed on the device under test.
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