Calibration method for apparatus evaluating microwave/millimeter wave circuits
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United States of America Patent
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Aug 1, 1989
Grant Date -
N/A
app pub date -
Oct 27, 1987
filing date -
Oct 27, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A calibration procedure for vector network analyzers utilizing a known standard, an unknown standard and a pair of offsets bearing a known length ratio (2:1) between them whereby measurements taken on the standards and their combinations with the offsets result in self-verifying redundant equations which furnish: (1) error terms according to well-known flow graph models, (2) the reflection of the unknown standard, (3) the transmission factor of the waveguiding medium from which the offsets are realized regardless of the waveguide's loss or dispersion, and (4) a figure of merit (corruption coefficient) for the quality of the acquired raw data without the necessity for computing the error terms, connecting verification standards or otherwise completing the calibration process.
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