Digitizer effective resolution measurement system using sinewave parameter estimation
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United States of America Patent
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Aug 15, 1989
Grant Date -
N/A
app pub date -
Aug 5, 1987
filing date -
Aug 5, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for determining the effective bits of resolution of a digitizer wherein amplitude, frequency, phase angle and offset parameters characterizing a sinewave input signal to the digitizer are estimated from the waveform data sequence produced by the digitizer in response to the input signal. These estimated parameters are used to develop a model of the sinewave signal, and the effective bits of resolution of the digitizer are then determined by the comparing measured magnitudes of the sinewave signal as represented by the waveform data sequence to estimated magnitudes of the input signal being determined from the model.
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