X-ray scanner with secondary radiation detector

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United States of America Patent

PATENT NO 4870670
SERIAL NO

07253484

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Abstract

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An article inspection system has separate detectors for primary radiation and scattered radiation which are generated by an article upon being irradiated with X-radiation. The scattered radiation detector is disposed so that no primary radiation is incident thereon. The primary radiation detector is scanned at a frequency to produce a primary radiation image. The scattered radiation incoming to the scattered radiation detector is modulated at a frequency synchronized with the scanning frequency for the primary radiation detector, so that only scattered radiation is incident on the scattered radiation detector which emanates from the region of the article which is currently being scanned for primary radiation.

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Patent Owner(s)

Patent OwnerAddress
HEIMANN GMBHWIESBADEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Geus, Georg Wiesbaden, DE 21 1752

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