Apparatus and method for particle analysis

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United States of America Patent

PATENT NO 4871251
SERIAL NO

07119797

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Abstract

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Apparatus for analyzing particles contained in a fluent edium (12). The apparatus includes a body (20) having a window (30), an optical source preferably comprising a laser diode (100) having a small light emitting area (140), and an optical system (102) for focusing the light from the laser diode at a focal spot (84) such that the size of the focal spot is approximately equal to the size of the light emitting area of the laser diode. A photodetector (106) is mounted in the body and detects light backscattered from the focal spot by particles in the fluent medium, and produces an electrical signal that comprises a series of pulses associated with the particles. The electrical signal is input to a detector that counts the pulses and indicates the number of particles in the fluent medium. The detector includes discrimination means for preventing the counting of a pulse that has a rise or fall time above a predetermined threshold, thereby discriminating against particles that are not at the focal spot. Means are provided for measuring the integrated amplitude of the electrical signal, and for varying the distance between the focal spot and the window to maximize such integrated amplitude. An intrinsically safe embodiment is also disclosed in which the probe positioned at the measuring site does not include any electrical components. This embodiment may be implemented using light of multiple wavelengths for characterizing individual particles.

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Patent Owner(s)

Patent OwnerAddress
METTLER-TOLEDO AUTOCHEM INC7075 SAMUEL MORSE DRIVE COLUMBIA MD 21046

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Preikschat, Ekhard 9048 N.E. 41st Street, Bellevue, WA 98004 10 175
Preikschat, Fritz K 16020 Lake Hills Blvd., Bellevue, WA 98008 7 225

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