Method and apparatus for surface treating of substrates

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4871417
SERIAL NO

07069541

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A method for surface treating of thin substrates such as semiconductor wafers, wherein a semiconductor wafer formed with relatively deep but transversely minute trenches on its surface is horizontally placed on a spinner in a chamber with its trenched surface directed up, ultraviolet light is then emitted onto the surface of the wafer to dissolve impurities sticking in the trenches, and thereafter etchant is spouted from a nozzle to the trenched surface of the wafer being spinned about a vertical axis at a high speed. Next, the inside of the chamber is subjected to a lower pressure than atmospheric pressure, and atmospheric pressure is restored after the lapse of a predetermined time. Thus a series of these steps of etchant supplying, pressure reducing, and pressure recovering are carried out until the complete entrance of the etchant into the interior surfaces of the trenches is effected, so as to even or smooth the interior surfaces and, finally the wafer is treated with rinsing, heating and drying steps.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
DAINIPPON SCREEN MFG CO LTD KYOTO JAPANNot Provided

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Morita, Masaru Minami, JP 25 271
Nishizawa, Hisao Shiga, JP 10 439
Tanaka, Masato Nagahama, JP 502 4885

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation