Semiconductor radiation detector

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United States of America Patent

PATENT NO 4879466
SERIAL NO

07150205

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A structure of semiconductor radiation detector element having a p-n junction comprises a substrate layer including a radiation absorbing layer having a silicon equivalent thickness not smaller than 140 .mu.m and located adjacent to a depletion layer formed at the p-n junction. With the simplified structure, both the detection sensitivity and the energy compensating performance are enhanced significantly.

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Patent Owner(s)

  • HITACHI, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Izumi, Shigeru Tokyo, JP 30 305
Kitaguchi, Hiroshi Ibaraki, JP 136 1321
Suzuki, Satoshi Mito, JP 687 8271

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