Semiconductor integrated circuit devices and methods for testing same
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United States of America Patent
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Nov 14, 1989
Grant Date -
N/A
app pub date -
Sep 26, 1986
filing date -
Sep 30, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor integrated circuit device, comprises a semiconductor integrated circuit chip having a plurality of signal wires and a plurality of test terminals connected to said signal wires. The test terminals are concentrated in at least one selected circuit area of the semiconductor integrated circuit chip to permit chip diagnosis using an image mode electron beam detector.
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