Laser beam scanning method for forming via holes in polymer materials

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United States of America Patent

PATENT NO 4894115
SERIAL NO

07310149

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Abstract

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The surface of a polymer dielectric layer is scanned repeatedly with a high energy continuous wave laser in a pattern to create via holes of desired size, shape and depth. This is followed by a short plasma etch. The via holes are produced at commercial production rates under direct computer control without use of masks and without damage to conductor material underlying the dielectric layer. A two-step technique usable to form a large hole to a partial depth in the dielectric layer and several smaller diameter holes within the large hole through the remainder of the dielectric layer depth allows formation of a large number of holes in a given area of a thick dielectric layer.

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Patent Owner(s)

Patent OwnerAddress
LOCKHEED MARTIN CORPORATION6801 ROCKLEDGE DRIVE BETHESDA MD 20817

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Eichelberger, Charles W Schenectady, NY 110 7657
Welles, II Kenneth B Scotia, NY 44 2691
Wojnarowski, Robert J Ballston Lake, NY 93 7220

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