Discrete die burn-in for nonpackaged die
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United States of America Patent
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-
Feb 6, 1990
Grant Date -
N/A
app pub date -
Sep 30, 1988
filing date -
Sep 30, 1988
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture is a die cavity plate for receiving semiconductor dice, and contains cavities in which die are inserted. The second half establishes electrical contact with the dice and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. After burn-in stress and electrical test, the die are removed from the test fixture and depositioned accordingly. The technique will allow all elements of the burn-in/test fixture to 100% reusable.
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Cited Art Landscape
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