Arrangement of a light wave conductor-phase sensor for the measurement of minute elongations
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United States of America Patent
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-
Feb 13, 1990
Grant Date -
N/A
app pub date -
Mar 6, 1989
filing date -
Mar 5, 1988
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
To measure exactly minute elongations, for example on airplanes or bridge structures by means of a light wave conductor-phase sensor, the measuring beams of polarized light at the output of the sensor is divided by means of a beam divider into three partial light beams. The first partial light beam is directly received by a first light receiver; the second light beam is transmitted through a quarter wavelength plate and an analyzer to the second light receiver; and a third partial light beam is transmitted through an analyzer to the third light receiver. The electrical output signals from the light receivers carry information about extreme refraction values of the measuring light beam and are supplied to an electronic evaluation circuit.
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