Apparatus having a buckling beam probe assembly
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United States of America Patent
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Feb 13, 1990
Grant Date -
N/A
app pub date -
Aug 19, 1988
filing date -
Aug 19, 1988
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for testing of electrical circuits has a buckling beam probe assembly having advantageous features that make it useful for contacting area arrays of test points, and for reliably establishing contact therewith. The probe elements remain essentially parallel even in the buckled state, and the probe tips execute a small 'wiping' movement on the contact point. In some preferred embodiments the probe tips are shaped to result in reduced contact area.
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