Importance

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Abstract

A test fixture is provided for contacting selected terminals (10, 10') of an electrical assembly for testing by a test device (28). The fixture includes spaced-apart upper platen (2), middle platen (4), and lower platen (6) that are selectively movable according to a selected one of: (a) platen (6) being secured against movement relative platens (2) and (4) and platens (2) and (4) being concurrently and/or independently movable towards and away from platen (6) and; (b) platens (2) and (4) are being secured against movement relative platen (6) and platen (6) being movable towards and away therefrom and; (c) platen (4) being secured against movement relative platens (2) and (6) and platens (2) and (6) being concurrently and/or independently movable relative platen (4). The assembly to be tested is mounted on platen (2) and slected electrical contacts (24, 24') extending towards platen (4) are respectively mounted on platen ( 6). Contacts (24, 24') are in substantial respective alignment with terminals (10, 10') and are electrically connected to test device (28). An array of openings (14) extend through platen (4) of which selected ones are substantially respectively aligned with terminals (10, 10') and contacts (24, 24'). Each of the selected openings (14) includes an electrically conductive probe member (30) reciprocally movable in opposite axial directions through opening (14) such that movement of the platens according to the selected one of movements (a), (b) and (c) provides electrical contact between terminals (10, 10') and the test device.

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First Claim