Multilayer diffraction grating

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United States of America Patent

PATENT NO 4915463
SERIAL NO

07259564

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Abstract

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This invention is for a reflection diffraction grating that functions at X-ray to VUV wavelengths and at normal angles of incidence. The novel grating is comprised of a laminar grating of period D with flat-topped grating bars. A multiplicity of layered synthetic microstructures, of period d and comprised of alternating flat layers of two different materials, are disposed on the tops of the grating bars of the laminar grating. In another embodiment of the grating, a second multiplicity of layered synthetic microstructures are also disposed on the flat faces, of the base of the grating, between the bars. D is in the approximate range from 3,000 to 50,000 Angstroms, but d is in the approximate range from 10 to 400 Angstroms. The laminar grating and the layered microstructures cooperatively interact to provide many novel and beneficial instrumentational advantages.

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Patent Owner(s)

Patent OwnerAddress
ENERGY THE UNITED STATES OF AMERICA AS REPRESENTED BY THE DEPARTMENT OFWASHINGTON DC 20585

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Barbee, Jr Troy W Palo Alto, CA 18 964

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