Importance

Loading Importance Indicators...

Abstract

For the testing of an integrated monolithic circuit (IC) the integrated monolithic circuit with a test bus which extends along a functional part of the circuit which is partitioned into macro circuits and which is coupled to the macro circuits, each macro circuit comprising a test interface circuit which is connected in series with test interface circuits of the other macro circuits; via the test interface circuits, the macro circuits can be coupled to the test bus. As a result, macro circuits can be separately tested and in the case of a hierarchic design of integrated circuits, utilizing previously designed marco circuits and test programs for previously designed macro circuits, test development times can be substantially reduced; this is an increasingly important aspect of increasingly complex circuits.

Loading the Abstract Image...

First Claim