Method of forming metal interconnects

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United States of America Patent

PATENT NO 4920072
SERIAL NO

07265157

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Abstract

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Metal interconnects and method for forming same such that an intermediately formed aluminum layer provides an etch stop and etch mask during the tungsten etch back. The method may be used to form tungsten contacts without requiring pre-metal planarization of the semiconductor body.

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Patent Owner(s)

Patent OwnerAddress
TEXAS INSTRUMENTS INCORPORATED 13500 NORTH CENTRAL EXPRESSWAY DALLAS TEXAS 75265 A CORP OF DEDE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adams, Martha S Rosenberg, TX 2 65
Harper, Ralph G Guy, TX 2 65
Keller, Stephen A Sugar Land, TX 15 390
Spry, Piper A Sugar Land, TX 2 65

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