Adjustable low inductance probe
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 8, 1990
Grant Date -
N/A
app pub date -
Oct 2, 1989
filing date -
Oct 2, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A low inductance probe contains a signal probe shaft having a signal probe point and an adjacent ground conductor or conductive shield for placing on the circuit location which is desired to be measured, a ground probe arm having a ground probe point for placing on a convenient ground location. The ground probe arm is attached to the signal probe shaft by means of a hinge which enable the ground probe arm to rotate between zero and approximately 135 degrees in a compass like fashion. The ground conductor of the signal probe shaft and the ground probe point of the ground probe arm are electrically connected by means of a low inductance ground lead consisting of a monolithic, flexible strand of conductive foil.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully