Loading and accurate measurement of integrated dynamic parameters at point of contact in automatic device handlers
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United States of America Patent
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May 22, 1990
Issued Date -
N/A
app pub date -
Jun 14, 1989
filing date -
Jan 20, 1988
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An interconnection device is disclosed that is connected between a semiconductor device to be tested and the tester to match the device output impedance with the load applied to the semiconductor device and to prevent reflection on input waveforms in propagation delay measurements.
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