Optical measurement of particle concentration
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United States of America Patent
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May 22, 1990
Grant Date -
N/A
app pub date -
Apr 6, 1987
filing date -
Apr 6, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Method and apparatus for measuring concentration of micrometer- and submicrometer-size particles on a carrier as a function of Mie scattering in the visible spectrum. A collimated beam of white light is directed through a carrier onto the particles, with a portion of the light energy being scattered and a portion transmitted according to Mie scattering theory. Particle size, index of refraction and measurement wavelength are selected such that scattering extinction varies essentially monotonically with the ratio of particle size to illumination wavelength. Particle concentration is indicated as a function of a difference between light scattered at two wavelengths at opposite ends of the visible spectrum.
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