Moisture measurement device
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United States of America Patent
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-
Jun 12, 1990
Issued Date -
N/A
app pub date -
Sep 5, 1989
filing date -
Jul 12, 1985
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of determining the moisture content of a material in which the material is caused to flow continually through a sensor region, the spatially averaged temperature of the material being continually determined independently of the dynamic thermal response of the material. The loss and capacitance of the sensor is also continually determined, the moisture content of the material than being determined in response to the spatially averaged temperature and the loss and capacitance determinations independently of changes in the packing density of the material as it continually flows through the sensor region.
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