Importance

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Abstract

An elastomeric connector for permanently or temporarily (for testing purposes) connecting area array chips without solder balls or wire bonds comprising an elastomer base material having through-hole conductors deposited therein, and surface conductor tabs which are electrically connected to the through-hole conductors deposited thereon. The surface conductor tabs have an overhanging contact region extending past the periphery of the through-hole conductors. Upon contact between the input/output pads of a chip and the overhanging contact regions of the elastomeric connector when aligned and biased towards each other, a requisite pressure causes a reactionary force by the elastomer base which facilites contact and automatic wipe. The elastomeric connectors may replace solder balls in chip connection applications, or may replace buckling beam test probe heads in chip test applications.

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First Claim