US Patent No: 4,933,634

Number of patents in Portfolio can not be more than 2000

Device and method to measure a short radiation pulse or an electric pulse

Stats

ATTORNEY / AGENT: (SPONSORED)
 

Importance

Loading Importance Indicators... loading....

Abstract

A device for measuring a single short pulse includes at least one measuring unit (D1, Dn) comprising a conductive line (L) connected to a set of photoconductors (A, B1-Bp), the line and photoconductors being placed between two nonconductors forming a single support in which the length of the line (x1) separating the photoconductors two-by-two is equal to the product of the propagation speed on the line with respect to the duration of the pulse concerning the number of measurement points, the lifetime of the majority carriers of the photoconductors being selected as being equal to or less than 10% of the duration of the pulse. The device makes it possible to obtain a temporal analysis or the autocorrelation of the pulse which may be an electromagnetic radiation or ionizing pulse or an electric pulse.

Loading the Abstract Image... loading....

First Claim

Related Publications

Loading Related Publications... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
COMMISSARIAT A L'ENERGIE ATOMIQUEPARIS3200
ORGANISATION EUROPEENNE POUR LA RECHERCHE NUCLEAIREGENEVA8

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cuzin, Marc Corenc, FR 10 167
Rossa, Edouard Gex, FR 1 61

Cited Art

Patent Info (Count) # Cites Year
 
UNIVERSITY OF ROCHESTER (2)
4,480,192 Optical pulse correlation measurement 10 1982
4,745,361 Electro-optic measurement (network analysis) system 16 1987
 
BELL TELEPHONE LABORATORIES, INCORPORATED (1)
4,482,863 Apparatus and method for measuring electronic response of high speed devices and materials 23 1981

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
CASCADE MICROTECH, INC. (48)
5,159,262 Method for measuring the electrical and optical performance of on-wafer microwave devices 27 1991
7,138,813 Probe station thermal chuck with shielding for capacitive current 14 2003
7,250,779 Probe station with low inductance path 23 2003
7,368,925 Probe station with two platens 3 2004
7,250,626 Probe testing structure 3 2004
7,221,172 Switched suspended conductor and connection 23 2004
7,492,172 Chuck for holding a device under test 4 2004
7,268,533 Optical testing device 3 2004
7,187,188 Chuck with integrated wafer support 74 2004
7,190,181 Probe station having multiple enclosures 4 2004
7,138,810 Probe station with low noise characteristics 7 2004
7,221,146 Guarded tub enclosure 5 2005
7,589,518 Wafer probe station having a skirting component 5 2005
7,554,322 Probe station 5 2005
7,330,041 Localizing a temperature of a device for testing 5 2005
7,330,023 Wafer probe station having a skirting component 3 2005
7,176,705 Thermal optical chuck 3 2005
7,352,168 Chuck for holding a device under test 9 2005
7,164,279 System for evaluating probing networks 2 2005
7,348,787 Wafer probe station having environment control enclosure 3 2005
7,656,172 System for testing semiconductors 3 2006
7,535,247 Interface for testing semiconductors 3 2006
7,295,025 Probe station with low noise characteristics 6 2006
7,292,057 Probe station thermal chuck with shielding for capacitive current 3 2006
7,504,823 Thermal optical chuck 2 2006
7,321,233 System for evaluating probing networks 7 2007
7,362,115 Chuck with integrated wafer support 14 2007
7,639,003 Guarded tub enclosure 2 2007
7,468,609 Switched suspended conductor and connection 4 2007
8,069,491 Probe testing structure 0 2007
7,498,828 Probe station with low inductance path 5 2007
7,436,170 Probe station having multiple enclosures 3 2007
7,492,147 Wafer probe station having a skirting component 3 2007
7,550,984 Probe station with low noise characteristics 3 2007
7,616,017 Probe station thermal chuck with shielding for capacitive current 0 2007
7,688,062 Probe station 0 2007
7,969,173 Chuck for holding a device under test 1 2007
7,518,358 Chuck for holding a device under test 11 2007
7,514,915 Chuck for holding a device under test 10 2007
7,501,810 Chuck for holding a device under test 10 2007
7,423,419 Chuck for holding a device under test 9 2007
7,626,379 Probe station having multiple enclosures 1 2007
7,595,632 Wafer probe station having environment control enclosure 5 2008
7,688,091 Chuck with integrated wafer support 1 2008
7,898,281 Interface for testing semiconductors 0 2008
7,876,115 Chuck for holding a device under test 1 2009
8,319,503 Test apparatus for measuring a characteristic of a device under test 0 2009
7,940,069 System for testing semiconductors 1 2009
 
ATTOFEMTO, INC. (5)
7,323,889 Voltage testing and measurement 7 2005
7,400,411 Method for optically testing semiconductor devices 5 2006
7,733,499 Method for optically testing semiconductor devices 1 2008
8,040,521 Holographic condition assessment system for a structure including a semiconductor material 1 2009
8,139,228 Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials 0 2010
 
FUJI MACHINE MFG. CO., LTD. (2)
5,926,950 Electronic component transferring device and method, and electronic component mounting system and method 15 1996
6,336,548 Apparatus for positioning electronic component holder head and apparatus for transferring electronic component 4 2000
 
DAVIS WRIGHT TREMAINE, LLP/SEATTLE (1)
7,206,078 Non-destructive testing system using a laser beam 8 2002
 
KABUSHIKI KAISHA TOSHIBA (1)
5,818,217 Electron beam irradiating apparatus and electric signal detecting apparatus 1 1994
 
M/A-COM TECHNOLOGY SOLUTIONS HOLDINGS, INC. (1)
5,142,224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals 101 1991
 
NOKIA SIEMENS NETWORKS GMBH & CO. KG (1)
7,088,925 Device for detecting polarization mode dispersion 5 2000
 
PFAFF, PAUL (1)
6,512,385 Method for testing a device under test including the interference of two beams 30 2000
 
THE UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL (1)
5,216,359 Electro-optical method and apparatus for testing integrated circuits 31 1991