Particle size analysis utilizing polarization intensity differential scattering
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United States of America Patent
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Sep 4, 1990
Grant Date -
N/A
app pub date -
Mar 3, 1989
filing date -
Mar 3, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Two arrangements are disclosed to provide high resolution measurement of sub-micrometer and micrometer particle size distributions. In a first arrangement, scattered light is measured over a wide range of scattering angles. At the same time, light scattered at low scattering angles is measured with high angular resolution. In the second arrangement an improved Polarization Intensity Differential Scattering (PIDS) measurement is made possible by providing an interrogating light beam of selected wavelength including a first component parallel to the scattering plane and a second component perpendicular to the scattering plane. Photodetecting arrangements detect light scattered by the particles at least at two scattering angles.
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