Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor

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United States of America Patent

PATENT NO 4954142
SERIAL NO

07285435

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Abstract

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Disclosed is a method of chem-mech polishing an electronic component substrate. The method includes the following steps; obtaining a substrate having at least two features thereon or therein which have a different etch rate with respect to a particular etchant; and contacting the substrate with a polishing pad while contacting the substrate with a slurry containing the etchant wherein the slurry includes abrasive particles, a transition metal chelated salt and a solvent for the salt. The chem-mech polishing causes the at least two features to be substantially coplanar. Also disclosed is the chem-mech polishing slurry.

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Patent Owner(s)

Patent OwnerAddress
CABOT MICROELECTRONICS CORPORATION870 NORTH COMMONS DRIVE AURORA IL 60504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Carr, Jeffrey W Fishkill, NY 18 564
David, Lawrence D Wappingers Falls, NY 32 741
Guthrie, William L Hopewell Junction, NY 25 2363
Kaufman, Frank B Amawalk, NY 10 580
Nenadic, Anton Red Hook, NY 11 439
Pasco, Robert W Wappingers Falls, NY 24 690
Patrick, William J Newburgh, NY 6 1214
Rodbell, Kenneth P Poughkeepsie, NY 127 1667

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