Wedge-filter spectrometer
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United States of America Patent
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Sep 18, 1990
Grant Date -
N/A
app pub date -
Dec 11, 1987
filing date -
Dec 11, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A wedge-filter spectrometer 1 comprises means 10 for spectrally dispersing an incident radiation beam comprising a first plurality of layers of high (H) index of refraction material and a second plurality of layers of low (L) index of refraction material, individual ones of the H and the L layers overlying one another in accordance with a given sequence, each of the H and the L layers having a substantially linearly tapered thickness of substantially constant slope, and means for detecting 17 at a plurality of points a spectrally dispersed radiation beam, the radiation beam being spectrally dispersed by the H and the L layers.
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