Integrated circuit test socket
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United States of America Patent
Stats
-
Oct 9, 1990
Grant Date -
N/A
app pub date -
Aug 19, 1988
filing date -
Aug 19, 1988
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Improved performance and reliability is obtained in test sockets for integrated circuits (ICs). Sufficient over-travel is provided to prevent pinching when the IC and its carrier are inserted in the test socket and the lid is latched closed. A power operated piston applies controllable and uniform pressure to force the IC leads onto contact pins in the test socket base. This controllable and uniform pressure prevents gouged IC leads, bent test socket pins, and other damage that prevents proper electrical and mechanical contact between IC leads and contact pins resulting in erroneous indications of faulty IC operation.
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- Non-US Classification not provided for expired patents
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