Test chamber for particle emitters
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United States of America Patent
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-
Nov 6, 1990
Grant Date -
N/A
app pub date -
May 2, 1989
filing date -
May 2, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test chamber is disclosed that permits standardized measurement of particles in the chamber environment. A device or structure that is suspected of the emitting particles and which is desired to be tested is located within the chamber. The chamber environment is then controlled by the introduction of filtered air thereby permitting both static measurements of particle emissions from the device or structure and flow through measurements of particle emissions from the device or structure.
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