Method of making a gallium arsenide phosphide-, mixed crystal-epitaxial wafer

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United States of America Patent

PATENT NO 4968642
SERIAL NO

07383161

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Abstract

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An epitaxial wafer for producing arrays of GaAsP-LEDs comprises, in the GaAs.sub.1-x P.sub.x layer with varying X, a layer region(s) with a discontinuous variance of x along the thickness of the GaAs.sub.1-x P.sub.x layer. This layer region(s) contribute to a uniformity in the brightness of the light emission of LEDs formed in the epitaxial wafer.

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Patent Owner(s)

  • MITSUBISHI CHEMICAL INDUSTRIES LIMITED;MITSUBISHI KASEI CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujita, Hisanori Ushiku, JP 38 1015
Kanayama, Masaaki Tsuchiura, JP 4 50
Okano, Takeshi Ushiku, JP 30 350

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