Controlled impedance testsite
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United States of America Patent
Stats
-
Nov 13, 1990
Grant Date -
N/A
app pub date -
Oct 5, 1987
filing date -
Oct 5, 1987
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A controlled impedance testsite for the testing of integrated circuits, including matched impedance cables. Decoupling capacitors are used in the matched impedance cables in test situations where high frequency decoupling is required. The testsite includes a socket style ejector and a spring return. The contacts are a flat wire style affixed to the flexible Kapton matched impedance cables. A contact board and BUS board are positioned for decoupling purposes at one end of each cable adjacent to the contact area of the testsite and the integrated circuit to be tested. A hard PWB with connection pins affixed is used as a termination contact point, and is positioned at the opposing end of each flexible cable.
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