Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO

4972092

SERIAL NO

07408532

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Apparatus for determining the effective surface roughness of polished optical samples, by measuring the total integrated scattering, only operates for non-light-transmissive samples. For a transmissive sample, the invention adds a light trap behind the sample for transmitted light, and a diaphragm in front of the sample. The rear surface of the diaphragm is provided with a non-reflective wafing which traps secondary light reflected or scattered by the inside rear surface of the sample.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
DEUTSCHE FORSCHUNGSANSTALT FUER LUFT- UND RAUMFAHRT E.V.COLOGNE38
DEUTSCHE FORSCHUNGSANSTALT FUR LUFT- UND RAUMFAHRT, LINDER HOHE, D-5000 KOLN 90, FED. REP. OF GERMANYCOLOGNE0

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rosteck, Helmut T A Wolfenbuttel, DE 1 9
Schmitt, Dirk-Roger Braunschweig, DE 3 19

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Swiss Aluminium Ltd. (1)
* 4703187 Method and apparatus for the determination of the thickness of transparent layers of lacquer 16 1986
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
6247238 Laser marking device 9 1999
 
UNITED MODULE CORPORATION (1)
* 5726455 Disk film optical measurement system 46 1996
 
TECHINT COMPAGNIA TECNICA INTERNAZIONALE S.P.A. (1)
6222628 Surface characteristics measurement system and method 20 1999
 
HDI Instrumentation (1)
* 5898181 Thin film optical measurement system 11 1997
 
ALLIANCE FOR SUSTAINABLE ENERGY, LLC (2)
* 6275295 Optical system for determining physical characteristics of a solar cell 8 1999
9234843 On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging 0 2011
 
SCHMITT MEASUREMENT SYSTEMS, INC. (2)
* 5625451 Methods and apparatus for characterizing a surface 27 1995
* 5661556 System for measuring the total integrated scatter of a surface 11 1996
 
Optomachines (3)
7041997 Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products 2 2001
* 2003/0184,740 Device and method for optical control of crockery items such as enamelled plates or and enamelled ceramic product 0 2002
* 2006/0180,775 Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products 6 2006
 
UNIVERSITY OF LEICESTER (1)
* 2010/0032,568 DETECTION OF THE ENERGY OF PHOTONS FROM BIOLOGICAL ASSAYS 1 2009
* Cited By Examiner