US Patent No: 4,972,092

Number of patents in Portfolio can not be more than 2000

Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation

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Abstract

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Apparatus for determining the effective surface roughness of polished optical samples, by measuring the total integrated scattering, only operates for non-light-transmissive samples. For a transmissive sample, the invention adds a light trap behind the sample for transmitted light, and a diaphragm in front of the sample. The rear surface of the diaphragm is provided with a non-reflective wafing which traps secondary light reflected or scattered by the inside rear surface of the sample.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
DEUTSCHE FORSCHUNGSANSTALT FUR LUFT-UND RAUMFAHRT E.V.COLOGNE38
DEUTSCHE FORSCHUNGSANSTALT FUR LUFT- UND RAUMFAHRT, LINDER HOHE, D-5000 KOLN 90, FED. REP. OF GERMANYCOLOGNE0

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rosteck, Helmut T A Wolfenbuttel, DE 1 8
Schmitt, Dirk-Roger Braunschweig, DE 3 17

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Swiss Aluminium Ltd. (1)
* 4,703,187 Method and apparatus for the determination of the thickness of transparent layers of lacquer 12 1986
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
SCHMITT MEASUREMENT SYSTEMS, INC. (2)
* 5,625,451 Methods and apparatus for characterizing a surface 25 1995
* 5,661,556 System for measuring the total integrated scatter of a surface 11 1996
 
ALLIANCE FOR SUSTAINABLE ENERGY, LLC (1)
* 6,275,295 Optical system for determining physical characteristics of a solar cell 7 1999
 
HDI INSTRUMENTATION (1)
* 5,898,181 Thin film optical measurement system 11 1997
 
OPTOMACHINES (1)
7,041,997 Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products 0 2001
 
TECHINT COMPAGNIA TECNICA INTERNAZIONALE S.P.A. (1)
6,222,628 Surface characteristics measurement system and method 18 1999
 
UNITED MODULE CORPORATION (1)
* 5,726,455 Disk film optical measurement system 35 1996
 
Other [Check patent profile for assignment information] (1)
6,247,238 Laser marking device 9 1999
* Cited By Examiner