Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation

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United States of America Patent

PATENT NO 4972092
SERIAL NO

07408532

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Apparatus for determining the effective surface roughness of polished optical samples, by measuring the total integrated scattering, only operates for non-light-transmissive samples. For a transmissive sample, the invention adds a light trap behind the sample for transmitted light, and a diaphragm in front of the sample. The rear surface of the diaphragm is provided with a non-reflective wafing which traps secondary light reflected or scattered by the inside rear surface of the sample.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
DEUTSCHE FORSCHUNGSANSTALT FUER LUFT- UND RAUMFAHRT E.V.COLOGNE38
DEUTSCHE FORSCHUNGSANSTALT FUR LUFT- UND RAUMFAHRT, LINDER HOHE, D-5000 KOLN 90, FED. REP. OF GERMANYCOLOGNE0

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rosteck, Helmut T A Wolfenbuttel, DE 1 9
Schmitt, Dirk-Roger Braunschweig, DE 3 19

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Swiss Aluminium Ltd. (1)
* 4703187 Method and apparatus for the determination of the thickness of transparent layers of lacquer 19 1986
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
6247238 Laser marking device 10 1999
 
UNITED MODULE CORPORATION (1)
* 5726455 Disk film optical measurement system 46 1996
 
TECHINT COMPAGNIA TECNICA INTERNATIONALE S.P.A. (1)
6222628 Surface characteristics measurement system and method 20 1999
 
HDI INSTRUMENTATION (1)
* 5898181 Thin film optical measurement system 11 1997
 
ALLIANCE FOR SUSTAINABLE ENERGY, LLC (2)
* 6275295 Optical system for determining physical characteristics of a solar cell 8 1999
9234843 On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging 0 2011
 
SCHMITT MEASUREMENT SYSTEMS, INC. (2)
* 5625451 Methods and apparatus for characterizing a surface 28 1995
* 5661556 System for measuring the total integrated scatter of a surface 12 1996
 
OPTOMACHINES (3)
7041997 Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products 2 2001
* 2003/0184,740 Device and method for optical control of crockery items such as enamelled plates or and enamelled ceramic product 1 2002
* 2006/0180,775 Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products 6 2006
 
UNIVERSITY OF LEICESTER (1)
* 2010/0032,568 DETECTION OF THE ENERGY OF PHOTONS FROM BIOLOGICAL ASSAYS 2 2009
* Cited By Examiner