Programmable device and method of testing programmable device

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United States of America Patent

PATENT NO 4972372
SERIAL NO

07221480

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Abstract

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A programmable device has a cell formation region having rows and columns of programmable cells arranged in a matrix arrangement, a real cell region within the cell formation region and constituted by the programmable cells which are to be actually programmed, a test bit region within the cell formation region and including a number of rows of the programmable cells so as to include all kinds of the programmable cells within the real cell region, and a test word region within the cell formation region and including a number of columns of the programmable cells so as to include all kinds of the programmable cells within the real cell region. All of the programmable cells within the real cell region can essentially be tested by testing the programmable cells within the test bit region and the test word region.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU LIMITED 1015 KAMIKODANAKA NAKAHARA-KU KAWASAKI-SHI KANAGAWA 211 JAPANNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ueno, Kouji Inagi, JP 65 758

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