Microcircuit probe and method for manufacturing same
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United States of America Patent
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-
Dec 25, 1990
Grant Date -
N/A
app pub date -
May 26, 1989
filing date -
May 26, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An electrically conductive probe of controlled shape and dimension useful in testing the functionality and performance of microcircuits and a method for manufacturing it are disclosed. The probe may be generally square or rectangular in cross section and consists of three distinct sections; the terminal end which is capable of being electrically contacted, the shaft which connects the terminal end to the probe tip, and the probe tip which is to make electrical contact with a microcircuit.
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