Electrical testing probe
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United States of America Patent
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-
Jan 22, 1991
Grant Date -
N/A
app pub date -
Dec 12, 1989
filing date -
Dec 15, 1988
priority date (Note) -
Expired
status (Latency Note)
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Abstract
For contacting electrical pads of different geometries, an electrical testing probe including a probe body which is generally laminar and which tapers downwardly to provide a contact portion; and a carrying member which carries said probe body.
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Cited Art Landscape
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