Optimal test generation for finite state machine models
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United States of America Patent
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Feb 5, 1991
Grant Date -
N/A
app pub date -
Jun 7, 1989
filing date -
Jun 7, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Faster, yet, completely efficient and exhaustive testing is afforded an entity (e.g., protocol, VLSI circuit, software application) represented as finite state machines by employing the present method in which test sequences are generated according to minimum cost function rules. Minimum cost unique signatures are developed for state identification of the finite state machine. Based upon the minimum cost unique signatures, a minimum cost test sequence is generated to cover every state transition of the finite state machine. As a result, every testable aspect of the entity is guaranteed to be tested using a minimum number of steps which represents a considerable cost savings.
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