Dual beam optical nulling interferometric spectrometer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 12, 1991
Grant Date -
N/A
app pub date -
Jul 31, 1989
filing date -
Jul 31, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A dual beam Fourier transform spectrometer produces two beams from a single infrared (IR) source. The beams are directed through a sample region, with one beam transiting a sample and the other beam transiting a reference cell. The sample and reference beams are then directed to a Michelson interferometer with cube corner retroflectors for optically cancelling the background signal from the separate sample and reference beams and for optically combining the sample and reference beams in an optically accurate and stable manner. The single combined beam, which contains the difference interferogram is directed to a single detector.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully