Method and apparatus for evaluating defects of an object
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United States of America Patent
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Mar 12, 1991
Grant Date -
N/A
app pub date -
Jan 12, 1989
filing date -
Jan 12, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Apparatus and method for evaluating the defects in an object wherein data related to the object is processed to develop an indication for each defect in a first group of defects and to further develop a composite indication for the defects in the remaining composite group of defects and wherein, depending upon the level of the composite indication, the data is further processed with respect to the composite group of defects.
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