Functional testing of ultra large area, ultra large scale integrated circuits
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United States of America Patent
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Apr 16, 1991
Grant Date -
N/A
app pub date -
Jun 20, 1989
filing date -
Jun 20, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Disclosed is a method of testing ultra large area integrated circuits. The circuit has a plurality of individually addressable elements. The method comprises providing a dispersed chargeable powder with the integrated circuit in proximity to and above the powder. At least one device of the integrated circuit is electrically selected. An electrical potential is applied between the integrated circuit and the dispersed powder. The potential causes the chargeable particles to adhere to substantially only functional selected devices of the integrated circuit, thereby differentiating between functional and non-functional devices.
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