Wafer prober

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United States of America Patent

PATENT NO 5010296
SERIAL NO

07492051

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A wafer prober includes a supporting device for supporting a wafer on which a plurality of electrode pads are disposed, a plurality of probes for contacting respective electrode pads, a spraying device for spraying a gas onto the electrode pads contacted by the plurality of probes, and an aspirating device for aspirating waste generated by the contact of the probes with the electrode pads and carried by the gas.

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Patent Owner(s)

  • MITSUBISHI DENKI KABUSHIKI KAISHA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kusumoto, Ichirou Kawanishi, JP 1 62
Okada, Kazuhisa Itami, JP 40 449

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