Electrical probe with contact force protection
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Apr 30, 1991
Grant Date -
N/A
app pub date -
Jun 8, 1990
filing date -
Jun 8, 1990
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An electrical probe tip is yieldably mounted on a probe mount so that, as the probe mount and a device under test are advanced toward each other, the contact force between the probe tip and the device under test first increases gradually and then decreases. This prevents excessive contact force if the probe mount and device under test are inadvertently advanced excessively toward each other, and thereby prevents damage to the probe tip.
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