Off axis rotation of diffraction grating
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United States of America Patent
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May 14, 1991
Grant Date -
N/A
app pub date -
Feb 17, 1989
filing date -
Feb 17, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In a spectrophotometer application where high speed positioning is critical, a galvanometer in conjunction with a microprocessor controlled hybrid digital/analog servo system is used to rotate a diffraction grating for wavelength selection. A table containing digital position information for all wavelengths is accessed by the microprocessor to perform wavelength changes. The use of the table permits the determination of grating position to yield a desired wavelength for a system where the axis of rotation does not intersect a point on the surface of the diffraction grating. That is, the diffraction grating can be rotated about an axis coinciding with its center of gravity.
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