US Patent No: 5,015,094

Number of patents in Portfolio can not be more than 2000

Particle size measuring system

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Abstract

There is disclosed a system in which, according to the time domain method, a laser light is irradiated to an object to be measured, photon pulses based on the scattering light from the object to be measured are received, time series data are generated based on the light receiving signal, and based on the time series data thus generated, the particle size distribution of particles in the object to be measured is measured. Thus, the present invention achieves a considerable reduction in time required for finally obtaining the particle size based on the measured data, as compared with a conventional system using a calculator program.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
OTSUKA ELECTRONICS CO., LTD.OSAKA38

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawaguchi, Akira Yamato, JP 48 304
Kumagai, Kunio - 7 18
Morisawa, Katsuhiro Kyoto, JP 5 28
Oka, Koichi Otsu, JP 28 77

Cited Art

Patent Info (Count) # Cites Year
 
KOWA COMPANY, LTD. (1)
4,830,494 Method and apparatus for measuring particles in a fluid 36 1987

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
HORIBA, LTD. (2)
5,428,443 Laser diffraction-type particle size distribution measuring method and apparatus 8 1993
6,473,177 Particle-size distribution measuring apparatus 2 2001
 
KOWA COMPANY, LTD. (2)
5,172,004 Method and apparatus for measuring particles in a fluid 3 1991
5,907,399 Particle measurement apparatus 14 1993
 
BREAULT RESEARCH ORGANIZATION, INC. (1)
5,475,617 Process of reconstructing a single data profile of rapidly measured hemispherical scattered or radiated light 14 1994
 
GAZTECH CORPORATION (1)
5,384,640 Gas sample chamber for use with a source of coherent radiation 15 1993
 
HITACHI, LTD. (1)
5,316,983 Apparatus for analysis of particulate material, analytical method for same, apparatus for production of ultrapure water, apparatus for manufacturing of semiconductor, and apparatus for production of pure gas 17 1991
 
OTSUKA ELECTRONICS CO., LTD. (1)
6,885,448 Photon correlator 1 2002
 
PHOTON DYNAMICS, INC. (1)
5,764,209 Flat panel display inspection system 48 1995
 
THE RESEARCH FOUNDATION OF STATE UNIVERSITY OF NEW YORK (1)
5,627,642 Method and apparatus for submicroscopic particle sizing by measuring degree of coherence 7 1995
 
OTHER [CHECK PATENT PROFILE FOR ASSIGNMENT INFORMATION] (1)
6,587,200 Method of measuring particle sizes 4 2001