Particle size measuring system
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United States of America Patent
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-
May 14, 1991
Grant Date -
N/A
app pub date -
Sep 28, 1989
filing date -
Oct 3, 1988
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
There is disclosed a system in which, according to the time domain method, a laser light is irradiated to an object to be measured, photon pulses based on the scattering light from the object to be measured are received, time series data are generated based on the light receiving signal, and based on the time series data thus generated, the particle size distribution of particles in the object to be measured is measured. Thus, the present invention achieves a considerable reduction in time required for finally obtaining the particle size based on the measured data, as compared with a conventional system using a calculator program.
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