Built-in current testing of integrated circuits
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United States of America Patent
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Jun 18, 1991
Issued Date -
N/A
app pub date -
Feb 22, 1990
filing date -
Nov 30, 1988
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A built in current sensor on a unitary substrate with an integrated circuit is provided to sense abnormal quiescent current flow through the integrated circuit after a timing phase as an indication of defects such as shorts and open circuits, while ignoring normal high current peaks. A comparator is provided along with an adjustable reference current to provide a virtual ground voltage which represents that induced by a normal quiescent current through a fault-free integrated circuit. A breaker circuit may be provided for indication, or power disconnection of the integrated circuit, upon the occurrence of current flow above a predetermined value.
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