Process for testing individual one piece receptacles
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United States of America Patent
Stats
-
Jul 16, 1991
Grant Date -
N/A
app pub date -
Mar 12, 1990
filing date -
Mar 13, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Process and apparatus for the quality control of individual, one-piece receptacles, which are open at one end. The individual, one-piece receptacles are preferably aligned, in several groups, side by side, similarly with respect to their spatial orientation. The receptacles are turned over to a conveyor line where they pass through at least one testing station at which measurement results specific to each type of receptacle are obtained. The analysis of these results indicates the structural integrity and accuracy of shape of the respective receptacle. The receptacles, as a function of the receptacle-specific measurement results, are removed from the conveyor line if defective; and only the structurally integral and shape-accurate acdeptable receptacles are stacked and further advanced as a stack.
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