Electrooptic measurement systems for frequency analysis of very wide range signals
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United States of America Patent
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Aug 20, 1991
Grant Date -
N/A
app pub date -
Jul 17, 1989
filing date -
Jul 19, 1988
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A spectrum analyzer for a variable amplitude and frequency electric signal includes an optical modulator responsive to the signal that derives a first optical wave having intensity and frequency components corresponding to the signal amplitude and frequency components. An optical analyzer responds to the first optical wave to derive a second optical wave having intensity variations at frequency components corresponding to the amplitude of the electric signal at the frequencies in the spectrum of the signal. The optical analyzer includes a tunable optical cavity responsive to the first optical wave to derive the second optical wave.
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