Particle analyzing apparatus and method for determining nuclear shift index

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United States of America Patent

PATENT NO 5047963
SERIAL NO

07401983

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Abstract

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A particle suspension is irradiated with a laser beam, and side-scattered light from a single particle irradiated in an irradiating zone is detected as one or a plurality of particle signals. The degree of complexity of the particle nucleus is determined by extracting high-frequency signal components contained in the particle signal, and the degree of symmetry of the particle nucleus is determined by extracting the magnitude of a difference between this single particle signal and a signal obtained by flipping over the particle signal in terms of time. The degrees of complexity and symmetry of the particle nucleus serve as data for particle analysis.

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Patent Owner(s)

Patent OwnerAddress
TOA MEDICAL ELECTRONICS CO LTDCHUOKU KOBE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kosaka, Tokihiro Hyogo, JP 35 2089

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