Method and apparatus for particle size analysis
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United States of America Patent
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Oct 15, 1991
Grant Date -
N/A
app pub date -
Mar 3, 1989
filing date -
Mar 3, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Methods and apparatus for measuring the intensity of light scattered by particles suspended in a sample volume illuminated by an interrogating light beam directed along an input axis, utilizing plural Fourier optical systems having lenses arranged for illuminating multiple photodetectors. The lenses of each Fourier optical system can be of different optical powers, for providing low power and high power optical trains. A low power optical train provides high resolution measurements of light scattered within a small angular range at low angles relative to the input axis, while a high power optical train provides lower resolution measurements of light scattered within a larger angular range at higher angles.
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